Analytical services

Chemical and molecular analysis

Chemical and molecular analysis is an integral part of any metallurgical research activity. As a result, we have developed expertise in most analytical techniques and procedures and offer high-quality chemical analytical services.

For destructive and non-destructive quantitative elemental analysis of liquid or solid samples we implement:

  • Atomic Absorption spectroscopy
  • Inductively coupled plasma spectroscopy
  • Flame Photometry
  • X-ray fluorescence spectroscopy

For the molecular analysis of solid and liquid samples we perform:

  • IR-FTIR spectroscopy
  • X-ray diffraction TOPAS analysis
  • Raman and Microraman spectroscopy

For the conduction of chemical and molecular analysis, our laboratory is equipped with the following analytical instruments:

  • Perkin Elmer PinAAcle 900T Atomic Absorption Spectrometer
  • Perkin Elmer Optima™ 8000 ICP-OES Inductively coupled plasma spectrometer
  • Perkin Elmer NexION 1000 ICP Mass Spectrometer
  • BWB XP Flame Photometer
  • SPECTRO XEPOS X-ray fluorescence spectrometer
  • Perkin Elmer Spectrum™ 100 Optica IR-FTIR Spectrometer
  • Rigaku MiniFlex benchtop XRD
Materials characterization

Measurement of physical properties is often the most important indicator of success of a metallurgical process.

Our analytical team has experience in a wide variety of techniques dedicated to the quantification of several physical processes.

We execute:

  • Wet and dry particle size distribution analysis
  • Qualitative and quantitative phase analysis of poly-crystalline materials
  • Density measurement of solid samples
  • Analysis of topography, morphology and microstructure of materials
  • Study of thermal stability, thermal decomposition, phase transitions, melting points, enthalpy changes and heat capacities of solid samples

We provide these services by means of the following equipment:

  • HORIBA LA-960V2 Laser Particle Analyzer
  • Rigaku MiniFlex benchtop XRD
  • Quantachrome Model SPY-D160E Stereopycnometer
  • Scanning Electron Microscope (SEM Jeol6380LV)
  • Transmission Electron Microscope (ΤEM Jeol 2100 HR, 200kV)
  • Thermogravimetric analyzer
  • Thermogravimeter-Differential thermal analyzer (SETARAM Labsys™ TG- DTA/DSC)